New York, NY (PRWEB) April 8, 2009 - Board Certified Eye Surgeon Dr. Kevin Niksarli, M.D. of Manhattan Lasik Center, assesses the repeatability of measurements of higher order aberrations using three different aberrometers and to compare higher order aberration measurements between optical path difference (OPD) scanning and the Hartmann-Shack method.

The study was designed and conducted with collaboration of Drs. Ahmet Burakgazi, Bernard Tinio, Alejandro Bababyan, Kevin Niksarli, and Penny Asbell.

Wavefront aberration data obtained using the NIDEK OPD-Scan, Bausch & Lomb Zywave wavefront aberrometer, and VISX CustomVue wavefront analyzer were compared.

A total of 19 subjects were included in the study. Repeatability errors in all three machines were found to be low, suggesting that all three machines are reliable in their repeated measurements. Significant differences were demonstrated between OPD scanning and Hartmann-Shack aberrometers.

All three machines showed statistically significant differences in several higher order aberration parameters when compared to each other.

Dr. Kevin Niksarli, M.D. of Manhattan Lasik Center, concludes that the three different aberrometers provided repeatable measurements, but statistical differences were noted in the measurement of higher order aberrations when comparing the machines.

The study suggested that no instrument was superior over the others, and all three instruments were very reliable.